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1998 | ||
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1 | EE | Carl J. Wordelman, Thomas J. T. Kwan, Charles M. Snell: Comparison of statistical enhancement methods for Monte Carlo semiconductor simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 17(12): 1230-1235 (1998) |
1 | Thomas J. T. Kwan | [1] |
2 | Charles M. Snell | [1] |