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| 2001 | ||
|---|---|---|
| 1 | EE | Loren J. Wise, Ronald D. Schrimpf, Harold G. Parks, Kenneth F. Galloway: A generalized model for the lifetime of microelectronic components, applied to storage conditions. Microelectronics Reliability 41(2): 317-322 (2001) |
| 1 | Kenneth F. Galloway | [1] |
| 2 | Harold G. Parks | [1] |
| 3 | Ronald D. Schrimpf | [1] |