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| 2005 | ||
|---|---|---|
| 1 | EE | Bonnie E. Weir, Che-Choi Leung, Paul J. Silverman, Muhammad A. Alam: Gate dielectric breakdown in the time-scale of ESD events. Microelectronics Reliability 45(3-4): 427-436 (2005) |
| 1 | Muhammad A. Alam | [1] |
| 2 | Che-Choi Leung | [1] |
| 3 | Paul J. Silverman | [1] |