Dao-zheng Wei
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1994
1
Dong Xiang
, Dao-zheng Wei: An Optimal Design for Parallel Test Generation Based on Circuit Partitioning.
VLSI Design 1994
: 297-300
Coauthor
Index
1
Dong Xiang
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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