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| 1986 | ||
|---|---|---|
| 1 | EE | Shui-Jinn Wang, Jau-Yien Lee, Chun-Yen Chang: An Efficient and Reliable Approach for Semiconductor Device Parameter Extraction. IEEE Trans. on CAD of Integrated Circuits and Systems 5(1): 170-179 (1986) |
| 1 | Chun-Yen Chang | [1] |
| 2 | Jau-Yien Lee | [1] |