| |
| 2003 | ||
|---|---|---|
| 1 | EE | Ru Huang, Jinyan Wang, Jin He, Min Yu, Xing Zhang, Yangyuan Wang: Hot carrier degradation behavior in SOI dynamic-threshold-voltage nMOSFET's (n-DTMOSFET) measured by gated-diode configuration. Microelectronics Reliability 43(5): 707-711 (2003) |
| 1 | Jin He | [1] |
| 2 | Ru Huang | [1] |
| 3 | Yangyuan Wang | [1] |
| 4 | Min Yu | [1] |
| 5 | Xing Zhang | [1] |