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2003 | ||
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1 | EE | Ru Huang, Jinyan Wang, Jin He, Min Yu, Xing Zhang, Yangyuan Wang: Hot carrier degradation behavior in SOI dynamic-threshold-voltage nMOSFET's (n-DTMOSFET) measured by gated-diode configuration. Microelectronics Reliability 43(5): 707-711 (2003) |
1 | Jin He | [1] |
2 | Ru Huang | [1] |
3 | Yangyuan Wang | [1] |
4 | Min Yu | [1] |
5 | Xing Zhang | [1] |