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| 2003 | ||
|---|---|---|
| 1 | EE | James M. Bieman, Greg Straw, Huxia Wang, P. Willard Munger, Roger T. Alexander: Design Patterns and Change Proneness: An Examination of Five Evolving Systems. IEEE METRICS 2003: 40-49 |
| 1 | Roger T. Alexander | [1] |
| 2 | James M. Bieman | [1] |
| 3 | P. Willard Munger | [1] |
| 4 | Greg Straw | [1] |