2006 | ||
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2 | EE | Chuan-Yu Chang, Hung-Jen Wang, Si-Yan Lin: Simulation Studies of Two-Layer Hopfield Neural Networks for Automatic Wafer Defect Inspection. IEA/AIE 2006: 1119-1126 |
1 | EE | Hung-Jen Wang, Chuan-Yu Chang, Sheng-Wen Pan: A DWT-based Robust Watermarking Scheme with Fuzzy ART. IJCNN 2006: 1750-1757 |
1 | Chuan-Yu Chang | [1] [2] |
2 | Si-Yan Lin | [2] |
3 | Sheng-Wen Pan | [1] |