Si-Yan Lin
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2006
1
EE
Chuan-Yu Chang
,
Hung-Jen Wang
, Si-Yan Lin: Simulation Studies of Two-Layer Hopfield Neural Networks for Automatic Wafer Defect Inspection.
IEA/AIE 2006
: 1119-1126
Coauthor
Index
1
Chuan-Yu Chang
[
1
]
2
Hung-Jen Wang
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
