2002 | ||
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3 | EE | R. Zhan, H. Feng, Q. Wu, G. Chen, X. Guan, A. Z. Wang: A new algorithm for ESD protection device extraction based on subgraph isomorphism. APCCAS (2) 2002: 361-366 |
2 | EE | H. Feng, R. Zhan, Q. Wu, G. Chen, X. Guan, A. Z. Wang: RC-SCR: a novel low-voltage ESD protection circuit with new triggering mechanism. APCCAS (2) 2002: 97-100 |
2001 | ||
1 | K. Gonf, H. G. Feng, R. Y. Zhan, A. Z. Wang: ESD-Induced Circuit Performance Degradation in RFICs. Microelectronics Reliability 41(9-10): 1379-1383 (2001) |
1 | G. Chen | [2] [3] |
2 | H. Feng | [2] [3] |
3 | H. G. Feng | [1] |
4 | K. Gonf | [1] |
5 | X. Guan | [2] [3] |
6 | Q. Wu | [2] [3] |
7 | R. Zhan | [2] [3] |
8 | R. Y. Zhan | [1] |