C. A. Waggoner
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2002
1
EE
D. Faure
, C. A. Waggoner: A New sub-micro probing technique for failure analysis in integrated circuits.
Microelectronics Reliability 42
(9-11): 1767-1770 (2002)
Coauthor
Index
1
D. Faure
[
1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)