| |
| 2005 | ||
|---|---|---|
| 1 | EE | Alessandro Marras, Ilaria De Munari, Davide Vescovi, Paolo Ciampolini: Impact of gate-leakage currents on CMOS circuit performance. Microelectronics Reliability 45(3-4): 499-506 (2005) |
| 1 | Paolo Ciampolini | [1] |
| 2 | Alessandro Marras | [1] |
| 3 | Ilaria De Munari | [1] |