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2005 | ||
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1 | EE | Alessandro Marras, Ilaria De Munari, Davide Vescovi, Paolo Ciampolini: Impact of gate-leakage currents on CMOS circuit performance. Microelectronics Reliability 45(3-4): 499-506 (2005) |
1 | Paolo Ciampolini | [1] |
2 | Alessandro Marras | [1] |
3 | Ilaria De Munari | [1] |