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| 1 | EE | S. Venkatraman, Sharad C. Seth, Prathima Agrawal: Parallel test generation with low communication overhead. VLSI Design 1995: 116-120 |
| 1 | Ajith Abraham | [3] |
| 2 | Prathima Agrawal | [1] |
| 3 | Marcin Paprzycki | [3] |
| 4 | Sharad C. Seth | [1] |
| 5 | R. Venkatraman | [2] |