Raja Venkatesh

2002
1	EE	Raja Venkatesh, Sailesh Kumar, Joji Philip, Sunil Shukla: A Fault Modeling Technique to Test Memory BIST Algorithms. MTDT 2002: 109-116

Coauthor Index

1	Sailesh Kumar	[1]
2	Joji Philip	[1]
3	Sunil Shukla	[1]