2005 |
5 | EE | J. B. da Silva Jr.,
Elder A. de Vasconcelos,
B. E. C. A. dos Santos,
J. A. K. Freire,
V. N. Freire,
G. A. Farias,
E. F. da Silva Jr.:
Statistical analysis of topographic images of nanoporous silicon and model surfaces.
Microelectronics Journal 36(11): 1011-1015 (2005) |
4 | EE | V. Anjos,
M. J. V. Bell,
Elder A. de Vasconcelos,
E. F. da Silva,
A. A. Andrade,
R. W. A. Franco,
M. P. P. Castro,
I. A. Esquef,
R. T. Faria:
Thermal-lens and photo-acoustic methods for the determination of SiC thermal properties.
Microelectronics Journal 36(11): 977-980 (2005) |
3 | EE | Walter M. de Azevedo,
E. F. da Silva,
Elder A. de Vasconcelos,
Henri Boudinov:
Visible photoluminescence from Ge nanoclusters implanted in nanoporous aluminum oxide films.
Microelectronics Journal 36(11): 992-994 (2005) |
2003 |
2 | EE | Jane M. G. Laranjeira,
E. F. da Silva Jr.,
Walter M. de Azevedo,
Elder A. de Vasconcelos,
Helen J. Khoury,
R. A. Simão,
C. A. Achete:
AFM studies of polyaniline nanofilms irradiated with gamma rays.
Microelectronics Journal 34(5-8): 511-513 (2003) |
1 | EE | Dyanna G. D. Teixeira,
Jane M. G. Laranjeira,
Elder A. de Vasconcelos,
E. F. da Silva,
Walter M. de Azevedo,
Helen J. Khoury:
Reliability physics study for semiconductor-polymer device development.
Microelectronics Journal 34(5-8): 713-715 (2003) |