2008 | ||
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2 | EE | Chao-Wen Tzeng, Jheng-Syun Yang, Shi-Yu Huang: A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques. ACM Trans. Design Autom. Electr. Syst. 13(1): (2008) |
1 | EE | Chao-Wen Tzeng, Shi-Yu Huang: UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting. IEEE Design & Test of Computers 25(2): 132-140 (2008) |
1 | Shi-Yu Huang | [1] [2] |
2 | Jheng-Syun Yang | [2] |