Chih-Chiang Tsao

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2002

1 EE Yu-Lung Lo, Chih-Chiang Tsao: Wirebond profiles characterized by a modified linkage-spring model which includes a looping speed factor. Microelectronics Reliability 42(2): 285-291 (2002)

2002
1	EE	Yu-Lung Lo, Chih-Chiang Tsao: Wirebond profiles characterized by a modified linkage-spring model which includes a looping speed factor. Microelectronics Reliability 42(2): 285-291 (2002)

Coauthor Index

1 Yu-Lung Lo [1]