K. S. Tsai

List of publications from the DBLP Bibliography Server - FAQ

1998

1 EE Wen-Ben Jone, K. S. Tsai: Confidence analysis for defect-level estimation of VLSI random testing. ACM Trans. Design Autom. Electr. Syst. 3(3): 389-407 (1998)

1998
1	EE	Wen-Ben Jone, K. S. Tsai: Confidence analysis for defect-level estimation of VLSI random testing. ACM Trans. Design Autom. Electr. Syst. 3(3): 389-407 (1998)

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