| 2008 |
|---|
| 9 | EE | Archie Lockamy III,
Paul Childerhouse,
Stephen M. Disney,
Denis R. Towill,
Kevin McCormack:
The impact of process maturity and uncertainty on supply chain performance: an empirical study.
IJMTM 15(1): 12-27 (2008) |
| 2006 |
|---|
| 8 | EE | Stephen M. Disney,
I. Farasyn,
Marc Lambrecht,
Denis R. Towill,
W. Van de Velde:
Taming the bullwhip effect whilst watching customer service in a single supply chain echelon.
European Journal of Operational Research 173(1): 151-172 (2006) |
| 2004 |
|---|
| 7 | EE | J. Dejonckheere,
Stephen M. Disney,
Marc Lambrecht,
Denis R. Towill:
The impact of information enrichment on the Bullwhip effect in supply chains: A control engineering perspective.
European Journal of Operational Research 153(3): 727-750 (2004) |
| 2003 |
|---|
| 6 | EE | J. Dejonckheere,
Stephen M. Disney,
Marc Lambrecht,
Denis R. Towill:
Measuring and avoiding the bullwhip effect: A control theoretic approach.
European Journal of Operational Research 147(3): 567-590 (2003) |
| 5 | EE | Paul Childerhouse,
Ramzi Hermiz,
Rachel Mason-Jones,
Andrew Popp,
Denis R. Towill:
Information flow in automotive supply chains - present industrial practice.
Industrial Management and Data Systems 103(3): 137-149 (2003) |
| 4 | EE | Paul Childerhouse,
Ramzi Hermiz,
Rachel Mason-Jones,
Andrew Popp,
Denis R. Towill:
Information flow in automotive supply chains - identifying and learning to overcome barriers to change.
Industrial Management and Data Systems 103(7): 491-502 (2003) |
| 2000 |
|---|
| 3 | EE | Denis R. Towill:
A Route Map for substantially improving supply chain dynamics.
IJMTM 1(1): 94-112 (2000) |
| 1981 |
|---|
| 2 | EE | K. C. Varghese,
C. Cresswell,
Denis R. Towill,
J. Hywel Williams:
Test feature selection for a complex electro-hydraulic servo system using frequency response measurements.
Pattern Recognition 14(1-6): 147-153 (1981) |
| 1978 |
|---|
| 1 | EE | K. C. Varghese,
J. Hywel Williams,
Denis R. Towill:
Computer aided feature selection for enhanced analogue system fault location.
Pattern Recognition 10(4): 265-280 (1978) |
