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Teck-Yong Tou

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2006
2EEKah-Yoong Chan, Teck-Yong Tou, Bee-San Teo: Thickness dependence of the structural and electrical properties of copper films deposited by dc magnetron sputtering technique. Microelectronics Journal 37(7): 608-612 (2006)
1EEKah-Yoong Chan, Teck-Yong Tou, Bee-San Teo: Effects of substrate temperature on electrical and structural properties of copper thin films. Microelectronics Journal 37(9): 930-937 (2006)

Coauthor Index

1Kah-Yoong Chan [1] [2]
2Bee-San Teo [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)