K. A. E. Totton
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1986
1
A. J. Briers
, K. A. E. Totton: Random Pattern Testability by Fast Fault Simulation.
ITC 1986
: 274-281
Coauthor
Index
1
A. J. Briers
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
