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| 2004 | ||
|---|---|---|
| 1 | Leeing Tong, Hsingyin Lee, Chifeng Huang, Changke Lin, Chienhui Yang: Constructing Control Process for Wafer Defects Using Data Mining Technique. ICEB 2004: 1125-1129 | |
| 1 | Chifeng Huang | [1] |
| 2 | Hsingyin Lee | [1] |
| 3 | Changke Lin | [1] |
| 4 | Chienhui Yang | [1] |