Hsingyin Lee

2004
1		Leeing Tong, Hsingyin Lee, Chifeng Huang, Changke Lin, Chienhui Yang: Constructing Control Process for Wafer Defects Using Data Mining Technique. ICEB 2004: 1125-1129

Coauthor Index

1	Chifeng Huang	[1]
2	Changke Lin	[1]
3	Leeing Tong	[1]
4	Chienhui Yang	[1]