S. Thomas III
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2001
1
EE
S. Thomas III,
C. H. Fields
,
M. Madhav
: RF modeling approach to determining end-of-life reliability for InP-based HBTs.
Microelectronics Reliability 41
(8): 1129-1135 (2001)
Coauthor
Index
1
C. H. Fields
[
1
]
2
M. Madhav
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
