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2006 | ||
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1 | EE | S. Singhal, T. Li, A. Chaudhari, A. W. Hanson, R. Therrien, J. W. Johnson, W. Nagy, J. Marquart, P. Rajagopal, J. C. Roberts: Reliability of large periphery GaN-on-Si HFETs. Microelectronics Reliability 46(8): 1247-1253 (2006) |
1 | A. Chaudhari | [1] |
2 | A. W. Hanson | [1] |
3 | J. W. Johnson | [1] |
4 | T. Li | [1] |
5 | J. Marquart | [1] |
6 | W. Nagy | [1] |
7 | P. Rajagopal | [1] |
8 | J. C. Roberts | [1] |
9 | S. Singhal | [1] |