R. Therrien

2006
1	EE	S. Singhal, T. Li, A. Chaudhari, A. W. Hanson, R. Therrien, J. W. Johnson, W. Nagy, J. Marquart, P. Rajagopal, J. C. Roberts: Reliability of large periphery GaN-on-Si HFETs. Microelectronics Reliability 46(8): 1247-1253 (2006)

Coauthor Index

1	A. Chaudhari	[1]
2	A. W. Hanson	[1]
3	J. W. Johnson	[1]
4	T. Li	[1]
5	J. Marquart	[1]
6	W. Nagy	[1]
7	P. Rajagopal	[1]
8	J. C. Roberts	[1]
9	S. Singhal	[1]