Y. S. Tang

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1979

1 S. S. Yau, Y. S. Tang: Generation of Shortest Test Sequences for Detecting Individual Faults of Sequential Circuits. Comput. J. 22(2): 169-172 (1979)

1979
1		S. S. Yau, Y. S. Tang: Generation of Shortest Test Sequences for Detecting Individual Faults of Sequential Circuits. Comput. J. 22(2): 169-172 (1979)

Coauthor Index

1 S. S. Yau [1]