| |
| 2001 | ||
|---|---|---|
| 1 | EE | L. Y. Sheng, C. De Tandt, Willy Ranson, Roger Vounckx: Reliability aspects of thermal micro-structures implemented on industrial 0.8 mum CMOS chips. Microelectronics Reliability 41(2): 307-315 (2001) |
| 1 | Willy Ranson | [1] |
| 2 | L. Y. Sheng | [1] |
| 3 | Roger Vounckx | [1] |