Hisashi Taketani

2001
2	EE	Reza Aghaeizadeh Zoroofi, Hisashi Taketani, Shinichi Tamura, Yoshinobu Sato, Kazuma Sekiya: Automated inspection of IC wafer contamination. Pattern Recognition 34(6): 1307-1317 (2001)
1993
1		Eung-Kyeu Kim, Jian-Tong Wu, Shinichi Tamura, Yoshinobu Sato, Robert Close, Hisashi Taketani, Hideo Kawai, Masahiro Inoue, Keiro Ono: Comparison of Neural Network and k-NN Classification Methods in Vowel and Patellar Subluxation Image Recognitions. IJPRAI 7(4): 775-782 (1993)

Coauthor Index

1	Robert Close	[1]
2	Masahiro Inoue	[1]
3	Hideo Kawai	[1]
4	Eung-Kyeu Kim	[1]
5	Keiro Ono	[1]
6	Yoshinobu Sato	[1] [2]
7	Kazuma Sekiya	[2]
8	Shinichi Tamura	[1] [2]
9	Jian-Tong Wu	[1]
10	Reza Aghaeizadeh Zoroofi	[2]