| |
| 2001 | ||
|---|---|---|
| 1 | EE | Reza Aghaeizadeh Zoroofi, Hisashi Taketani, Shinichi Tamura, Yoshinobu Sato, Kazuma Sekiya: Automated inspection of IC wafer contamination. Pattern Recognition 34(6): 1307-1317 (2001) |
| 1 | Yoshinobu Sato | [1] |
| 2 | Hisashi Taketani | [1] |
| 3 | Shinichi Tamura | [1] |
| 4 | Reza Aghaeizadeh Zoroofi | [1] |