Yuji Takagi

2005
2	EE	Yukinobu Sakata, Shun'ichi Kaneko, Yuji Takagi, Hirohito Okuda: Successive pattern classification based on test feature classifier and its application to defect image classification. Pattern Recognition 38(11): 1847-1856 (2005)
2002
1	EE	Hisae Shibuya, Yuji Takagi: Practical Pattern Detection from Distributed Defect Points on a Semiconductor Wafer. MVA 2002: 10-13

Coauthor Index

1	Shun'ichi Kaneko	[2]
2	Hirohito Okuda	[2]
3	Yukinobu Sakata	[2]
4	Hisae Shibuya	[1]

Colors in the list of coauthors