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Yukinobu Sakata

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2005
1EEYukinobu Sakata, Shun'ichi Kaneko, Yuji Takagi, Hirohito Okuda: Successive pattern classification based on test feature classifier and its application to defect image classification. Pattern Recognition 38(11): 1847-1856 (2005)

Coauthor Index

1Shun'ichi Kaneko [1]
2Hirohito Okuda [1]
3Yuji Takagi [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)