![]() | ![]() |
2005 | ||
---|---|---|
1 | EE | Yukinobu Sakata, Shun'ichi Kaneko, Yuji Takagi, Hirohito Okuda: Successive pattern classification based on test feature classifier and its application to defect image classification. Pattern Recognition 38(11): 1847-1856 (2005) |
1 | Shun'ichi Kaneko | [1] |
2 | Hirohito Okuda | [1] |
3 | Yuji Takagi | [1] |