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| 1997 | ||
|---|---|---|
| 1 | EE | Katsuyuki Takabatake, Michiko Inoue, Toshimitsu Masuzawa, Hideo Fujiwara: Non-scan design for testable data paths using thru operation. Systems and Computers in Japan 28(10): 60-68 (1997) |
| 1 | Hideo Fujiwara | [1] |
| 2 | Michiko Inoue | [1] |
| 3 | Toshimitsu Masuzawa | [1] |