Munehisa Taira

2001
1	EE	Sei Takahashi, Munehisa Taira, Hidetaka Saegusa, Takehiko Hoshino, Hideo Nakamura: Development of a Fail-Safe Microprocessor LSI with Self-Diagnosis Mechanism Depending on an M-Sequence Code Signature. PRDC 2001: 191-198

Coauthor Index

1	Takehiko Hoshino	[1]
2	Hideo Nakamura	[1]
3	Hidetaka Saegusa	[1]
4	Sei Takahashi	[1]