2001 | ||
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1 | EE | Sei Takahashi, Munehisa Taira, Hidetaka Saegusa, Takehiko Hoshino, Hideo Nakamura: Development of a Fail-Safe Microprocessor LSI with Self-Diagnosis Mechanism Depending on an M-Sequence Code Signature. PRDC 2001: 191-198 |
1 | Hideo Nakamura | [1] |
2 | Hidetaka Saegusa | [1] |
3 | Munehisa Taira | [1] |
4 | Sei Takahashi | [1] |