| |
| 1995 | ||
|---|---|---|
| 1 | EE | Hideaki Doi, Yoko Suzuki, Yasuhiko Hara, Tadashi Iida, Yasuhiro Fujishita, Koichi Karasaki: Real-Time X-Ray Inspection of 3D Defects in Circuit Board Patterns. ICCV 1995: 575-582 |
| 1 | Hideaki Doi | [1] |
| 2 | Yasuhiro Fujishita | [1] |
| 3 | Yasuhiko Hara | [1] |
| 4 | Tadashi Iida | [1] |
| 5 | Koichi Karasaki | [1] |