| 1998 |
|---|
| 4 | EE | Hilário Haruomi Kobayashi,
Yasuhiko Hara,
Hideaki Doi,
Kazuo Takai,
Akiyoshi Sumiya:
Hybrid Defect Detection Method Based on Shape Measurement and Feature Extraction for Complex Patterns.
MVA 1998: 177-182 |
| 1995 |
|---|
| 3 | EE | Hideaki Doi,
Yoko Suzuki,
Yasuhiko Hara,
Tadashi Iida,
Yasuhiro Fujishita,
Koichi Karasaki:
Real-Time X-Ray Inspection of 3D Defects in Circuit Board Patterns.
ICCV 1995: 575-582 |
| 1992 |
|---|
| 2 | EE | Hideaki Doi,
Yasuhiko Hara,
Koichi Karasaki,
Tadashi Iida,
Takashi Furutani,
Shigeki Kitamura,
Norihiro Minatani,
Satashi Shinada:
Automated Inspection of Printed Circuit Board Patterns Referenced to CAD Data.
MVA 1992: 419-4284 |
| 1988 |
|---|
| 1 | EE | Yasuhiko Hara,
Hideaki Doi,
Koichi Karasaki,
Tadashi Iida:
A System for PCB Automated Inspection Using Fluorescent Light.
IEEE Trans. Pattern Anal. Mach. Intell. 10(1): 69-78 (1988) |
