| |
| 2005 | ||
|---|---|---|
| 2 | EE | Jiaxing Sun, Yun Zheng, Qing Ye, Tianchun Ye: Interconnect Delay and Slew Metrics Using the First Three Moments. ISQED 2005: 598-602 |
| 1 | EE | Jiaxing Sun, Yun Zheng, Qing Ye, Tianchun Ye: Worst-Case Crosstalk Noise Analysis Based on Dual-Exponential Noise Metrics. VLSI Design 2005: 348-353 |
| 1 | Qing Ye | [1] [2] |
| 2 | Tianchun Ye | [1] [2] |
| 3 | Yun Zheng | [1] [2] |