| 2008 |
|---|
| 24 | EE | Tomás Suk,
Jan Flusser:
Affine moment invariants generated by automated solution of the equations.
ICPR 2008: 1-4 |
| 2006 |
|---|
| 23 | EE | Jan Flusser,
Tomás Suk:
Rotation Moment Invariants for Recognition of Symmetric Objects.
IEEE Transactions on Image Processing 15(12): 3784-3790 (2006) |
| 2005 |
|---|
| 22 | EE | Tomás Suk,
Jan Flusser:
Affine Normalization of Symmetric Objects.
ACIVS 2005: 100-107 |
| 21 | EE | Jan Flusser,
Tomás Suk:
Moment Invariants for Recognizing Symmetric Objects.
CAIP 2005: 9-16 |
| 2004 |
|---|
| 20 | EE | Tomás Suk,
Jan Flusser:
Graph Method for Generating Affine Moment Invariants.
ICPR (2) 2004: 192-195 |
| 19 | EE | Tomás Suk,
Jan Flusser:
Projective Moment Invariants.
IEEE Trans. Pattern Anal. Mach. Intell. 26(10): 1364-1367 (2004) |
| 2003 |
|---|
| 18 | EE | Jan Flusser,
Tomás Suk:
Construction of Complete and Independent Systems of Rotation Moment Invariants.
CAIP 2003: 41-48 |
| 17 | EE | Tomás Suk,
Jan Flusser:
Combined blur and affine moment invariants and their use in pattern recognition.
Pattern Recognition 36(12): 2895-2907 (2003) |
| 2002 |
|---|
| 16 | EE | Tomás Suk,
Jan Flusser:
Blur and Affine Moment Invariants.
ICPR (4) 2002: 339-342 |
| 2001 |
|---|
| 15 | EE | Tomás Suk,
Jan Flusser:
Features Invariant Simultaneously to Convolution and Affine Transformation.
CAIP 2001: 183-190 |
| 2000 |
|---|
| 14 | EE | Filip Sroubek,
Jan Flusser,
Tomás Suk,
Stanislava Simberová:
Multichannel Blind Deconvolution of the Short-Exposure Astronomical Images.
ICPR 2000: 3053-3056 |
| 13 | EE | Tomás Suk,
Jan Flusser:
Point-based projective invariants.
Pattern Recognition 33(2): 251-261 (2000) |
| 1999 |
|---|
| 12 | EE | Tomás Suk,
Jan Flusser:
Convex Layers: A New Tool for Recognition of Projectively Deformed Point Sets.
CAIP 1999: 454-461 |
| 1998 |
|---|
| 11 | EE | Jan Flusser,
Tomás Suk:
Degraded Image Analysis: An Invariant Approach.
IEEE Trans. Pattern Anal. Mach. Intell. 20(6): 590-603 (1998) |
| 1997 |
|---|
| 10 | | Tomás Suk,
Jan Flusser:
Point Projective and Permutation Invariants.
CAIP 1997: 74-81 |
| 1996 |
|---|
| 9 | EE | Jan Flusser,
Tomás Suk,
Stanislav Saic:
Recognition of blurred images by the method of moments.
IEEE Transactions on Image Processing 5(3): 533-538 (1996) |
| 8 | EE | Tomás Suk,
Jan Flusser:
Vertex-based features for recognition of projectively deformed polygons.
Pattern Recognition 29(3): 361-367 (1996) |
| 1995 |
|---|
| 7 | | Tomás Suk,
Jan Flusser:
The Projective Invariants for Polygons.
CAIP 1995: 729-734 |
| 6 | EE | Jan Flusser,
Tomás Suk,
Stanislav Saic:
Image features invariant with respect to blur.
Pattern Recognition 28(11): 1723-1732 (1995) |
| 1994 |
|---|
| 5 | | Jan Flusser,
Tomás Suk,
Stanislav Saic:
Recognition of Images Degraded by Linear Motion Blur without Restoration.
Theoretical Foundations of Computer Vision 1994: 37-51 |
| 4 | EE | Jan Flusser,
Tomás Suk:
Affine moment invariants: a new tool for character recognition.
Pattern Recognition Letters 15(4): 433-436 (1994) |
| 1993 |
|---|
| 3 | | Jan Flusser,
Tomás Suk:
Character Recognition by Affine Moment Invariants.
CAIP 1993: 572-577 |
| 2 | | Stanislava Simberová,
Tomás Suk:
Digital Processing of Skylab-X-Ray Images of the Solar Corona.
CAIP 1993: 759-765 |
| 1 | EE | Jan Flusser,
Tomás Suk:
Pattern recognition by affine moment invariants.
Pattern Recognition 26(1): 167-174 (1993) |
