Dong S. Suk

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1981

2 Dong S. Suk, Sudhakar M. Reddy: A March Test for Functional Faults in Semiconductor Random Access Memories. IEEE Trans. Computers 30(12): 982-985 (1981)

1980

1 Dong S. Suk, Sudhakar M. Reddy: Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories. IEEE Trans. Computers 29(6): 419-429 (1980)

1981
2		Dong S. Suk, Sudhakar M. Reddy: A March Test for Functional Faults in Semiconductor Random Access Memories. IEEE Trans. Computers 30(12): 982-985 (1981)
1980
1		Dong S. Suk, Sudhakar M. Reddy: Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories. IEEE Trans. Computers 29(6): 419-429 (1980)

Coauthor Index

1 Sudhakar M. Reddy [1] [2]