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| 1997 | ||
|---|---|---|
| 1 | EE | Paul B. Chou, A. Ravishankar Rao, Martin C. Sturzenbecker, Frederick Y. Wu, Virginia H. Brecher: Automatic defect classification for semiconductor manufacturing. Mach. Vis. Appl. 9(4): 201-214 (1997) |
| 1 | Virginia H. Brecher | [1] |
| 2 | Paul B. Chou | [1] |
| 3 | A. Ravishankar Rao | [1] |
| 4 | Frederick Y. Wu | [1] |