1997 | ||
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1 | EE | Paul B. Chou, A. Ravishankar Rao, Martin C. Sturzenbecker, Frederick Y. Wu, Virginia H. Brecher: Automatic defect classification for semiconductor manufacturing. Mach. Vis. Appl. 9(4): 201-214 (1997) |
1 | Paul B. Chou | [1] |
2 | A. Ravishankar Rao | [1] |
3 | Martin C. Sturzenbecker | [1] |
4 | Frederick Y. Wu | [1] |