| 2004 |
|---|
| 6 | EE | Tim Menzies,
Justin S. Di Stefano:
How Good Is Your Blind Spot Sampling Policy?
HASE 2004: 129-138 |
| 2003 |
|---|
| 5 | EE | Tim Menzies,
Justin S. Di Stefano,
Mike Chapman:
Learning Early Lifecycle IV&V Quality Indicators.
IEEE METRICS 2003: 88-97 |
| 4 | EE | Tim Menzies,
Justin S. Di Stefano,
Kareem Ammar,
Kenneth McGill,
Pat Callis,
Robert (Mike) Chapman,
John Davis:
When Can We Test Less?
IEEE METRICS 2003: 98- |
| 3 | EE | Valerie Wyatt,
Justin S. Di Stefano,
Mike Chapman,
Edward Aycoth:
A Metrics Based Approach for Identifying Requirements Risks.
SEW 2003: 23 |
| 2 | EE | Tim Menzies,
Justin S. Di Stefano:
More Success and Failure Factors in Software Reuse.
IEEE Trans. Software Eng. 29(5): 474-477 (2003) |
| 2002 |
|---|
| 1 | EE | Justin S. Di Stefano,
Tim Menzies:
Machine Learning for Software Engineering: Case Studies in Software Reuse.
ICTAI 2002: 246-251 |
