| |
| 2003 | ||
|---|---|---|
| 1 | EE | Tim Menzies, Justin S. Di Stefano, Kareem Ammar, Kenneth McGill, Pat Callis, Robert (Mike) Chapman, John Davis: When Can We Test Less? IEEE METRICS 2003: 98- |
| 1 | Kareem Ammar | [1] |
| 2 | Robert (Mike) Chapman | [1] |
| 3 | John Davis | [1] |
| 4 | Kenneth McGill | [1] |
| 5 | Tim Menzies | [1] |
| 6 | Justin S. Di Stefano | [1] |