| |
| 2008 | ||
|---|---|---|
| 1 | EE | Seung-Hyun Song, Jae-Chul Kim, Sung-Woo Jung, Yoon-Ha Jeong: Junction Depth Dependence of the Gate Induced Drain Leakage in Shallow Junction Source/Drain-Extension Nano-CMOS. IEICE Transactions 91-C(5): 761-766 (2008) |
| 1 | Yoon-Ha Jeong | [1] |
| 2 | Sung-Woo Jung | [1] |
| 3 | Jae-Chul Kim | [1] |