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2008 | ||
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1 | EE | Seung-Hyun Song, Jae-Chul Kim, Sung-Woo Jung, Yoon-Ha Jeong: Junction Depth Dependence of the Gate Induced Drain Leakage in Shallow Junction Source/Drain-Extension Nano-CMOS. IEICE Transactions 91-C(5): 761-766 (2008) |
1 | Sung-Woo Jung | [1] |
2 | Jae-Chul Kim | [1] |
3 | Seung-Hyun Song | [1] |