David Smeets
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2004
1
EE
David Smeets,
Josef Fazekas
: Quantifying charging damage in gate oxides of antenna structures for WLR monitoring.
Microelectronics Reliability 44
(8): 1245-1250 (2004)
Coauthor
Index
1
Josef Fazekas
[
1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
