Julien Simon
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2006
1
EE
Céline Bigot
,
Alain Faivre
,
Christophe Gaston
, Julien Simon: Automatic Test Generation on a (U)SIM Smart Card.
CARDIS 2006
: 345-358
Coauthor
Index
1
Céline Bigot
[
1
]
2
Alain Faivre
[
1
]
3
Christophe Gaston
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
