| 2006 |
|---|
| 4 | EE | Céline Bigot,
Alain Faivre,
Christophe Gaston,
Julien Simon:
Automatic Test Generation on a (U)SIM Smart Card.
CARDIS 2006: 345-358 |
| 2004 |
|---|
| 3 | EE | David Lugato,
Céline Bigot,
Yannick Valot,
Jean-Pierre Gallois,
Sébastien Gérard,
François Terrier:
Validation and automatic test generation on UML models: the AGATHA approach.
STTT 5(2-3): 124-139 (2004) |
| 2003 |
|---|
| 2 | EE | Céline Bigot,
Alain Faivre,
Jean-Pierre Gallois,
Arnault Lapitre,
David Lugato,
Jean-Yves Pierron,
Nicolas Rapin:
Automatic Test Generation with AGATHA.
TACAS 2003: 591-596 |
| 2002 |
|---|
| 1 | EE | David Lugato,
Céline Bigot,
Yannick Valot:
Validation and automatic test generation on UML models: the AGATHA approach.
Electr. Notes Theor. Comput. Sci. 66(2): (2002) |
