Y.-L. Shen
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2002
1
EE
M. S. Kilijanski
, Y.-L. Shen: Analysis of thermal stresses in metal interconnects with multilevel structures.
Microelectronics Reliability 42
(2): 259-264 (2002)
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Index
1
M. S. Kilijanski
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
