| 2000 |
|---|
| 4 | | M. Shakeri,
Vijay Raghavan,
Krishna R. Pattipati,
Ann Patterson-Hine:
Sequential testing algorithms for multiple fault diagnosis.
IEEE Transactions on Systems, Man, and Cybernetics, Part A 30(1): 1-14 (2000) |
| 1999 |
|---|
| 3 | | Vijay Raghavan,
M. Shakeri,
Krishna R. Pattipati:
Optimal and near-optimal test sequencing algorithms with realistic test models.
IEEE Transactions on Systems, Man, and Cybernetics, Part A 29(1): 11-26 (1999) |
| 2 | | Vijay Raghavan,
M. Shakeri,
Krishna R. Pattipati:
Test sequencing problems arising in test planning and design for testability.
IEEE Transactions on Systems, Man, and Cybernetics, Part A 29(2): 153-163 (1999) |
| 1 | | Vijay Raghavan,
M. Shakeri,
Krishna R. Pattipati:
Test sequencing algorithms with unreliable tests.
IEEE Transactions on Systems, Man, and Cybernetics, Part A 29(4): 347-357 (1999) |
